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Ion and Electron Probe
Probe Subsystem
The electron probe is biased at +5 V and designed to measure minute current fluctuations due to the electron density. Likewise, the ion probe is biased at 5 V and designed to measure minute fluctuations in ion density. They are thin platinum sheets that will be epoxied to the nose cone surface. Figure 3.3.5.1 indicates the probe board connector designations.Other probe details include:
Size: 5 cm x 10 cm x 0.02-0.05 mm (1.968 in x 3.937 in x 7.9E-4 to 1.96E-3 in)
Mass: 0.5 g (0.0176 oz)
Probe temperature-handling capability: > 177o C (350o F).
Probe channels: 4.
Analog output: 0-5 V
Cutoff frequency <50 Hz
Interface Requirements
The probe subsystem interfaces with 3 other systems: the flight computer, the power
supply, and the payload architecture. The probes connect to the probe PCB by SMA
connectors and 40 cm (15 in) long cables. Refer to Figure 3.3.4.6 for probe placement at the
antenna nulls. Figure 3.3.5.1 indicates the probe PCB connector designations.
For more information go to SRP4 Comprehensive Design Manual page 111

Probe Subsystem




