Advanced Instrumentation Laboratory
SEM picture copyright Lester Lefkowitz (631) 751-8310


JEOL JXA-8530F Electron Microprobe

Students in GEOS600 learning the JEOL JXA-8530F
Students in GEOS600 learning the JEOL JXA-8530F

The JEOL is our new baby!  Delivered in March 2013, we started getting it going in  Fall, 2013.  As of March 2014 it is largely operational (we are still learning) and we are sorting out some rather annoying bugs that no one expected. 

It would make a fabulous SEM because of its field emission electron source, but of course has rather limited stage movement because of its main mission which is x-ray analysis.  To that end, it has five WDS spectrometers, all with large area crystals. It also has a Thermo System 7 SDD-EDS system.  Control is through JEOL, Probe for EPMA, or Thermo-NSS software depending on the need.  Finally, it has a cathodoluminescence (CL) detector which can acomodate a variety of filters for specific wavelength detection.  Acquisition of the instrument was supported by the National Science Foundation under Grant Number 1126898. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.

CAMECA SX-50 Electron Microprobe

Our Cameca SX-50 electron microprobe is equipped with four multi-crystal wavelength-dispersive spectrometers (WDS) and one energy-dispersive spectrometer (EDS). The microprobe is fully automated using the PC-based software package Probe for Windows (Advanced Microbeam Co.), which allows rapid quantitative chemical analysis of elements from Boron to Uranium. Electron-beam scanning capability allows surface imaging in secondary and back-scattered electrons as well as x-ray compositional mapping.

Atomic Force Microscope

Our Pacific Nanotechnology Nano-R AFM can be used for the analysis of surfaces at the angstrom scale.

Transmission Electron Microscope

Our JEOL 1200 Transmission Electron Microscope can be used for detailed examination of thin biological and materials science samples.

Scanning Electron Microscope

The SEM is a superior tool for 2-D and 3-D imaging using secondary electrons and back-scattered electrons techniques. It is also capable of semi-quantitative chemical analysis and x-ray mapping using an EDS spectrometer. Our ISI-SR-50 Scanning Electron Microscope isautomated with iXRF software/hardware and an e2v SSD EDS detector which can measure >300,000 x-ray counts/second.


X-Ray Fluorescence Spectrometer

Our PanAlytical Axios four kilowatt wavelength dispersive XRF is used for quantitative analysis of bulk samples (approximately 10 grams) to the ppm level.

Inductively Coupled Plasma Mass Spectrometer

Our Agilent 7500ce ICPMS can do elemental analysis of liquids on the parts per trillion scale. Introduction systems include liquid chromatography for speciation studies and a New Wave UP213 laser for the analysis of solids. Contact Karen Spaleta for details.

X-Ray Diffraction

Our PANalytical Material Research MRD Diffractometer (MRD) x-ray diffractometer has many options and can be used for conventional and high resolution/quantitative powder x-ray diffraction, surface and thin film diffraction, and texture analysis. Contact Tom Trainor for details.

Fourier Transform Infrared Spectrometer

FTIR Thermo Scientific Nicolet 6700 with attached continuum microscope.  Capable of high-resolution infrared spectra of volatile species in volcanic glasses,  snow/ice impurities and aerosols.  Measures the attenuated total reflectance of sample surfaces.  Contact Jess Larsen for details.